Finally, this paper primarily establishes a testing method of characterization silicon carbide wafer quality.
最后，初步确立了表征碳化硅单晶抛光片质量的测试方法。
A method Configuration is a characterization of a version of the method (like RUP for Small Projects and RUP for Large Projects).
方法配置是对方法(如小项目的RUP和大项目的RUP)的一个版本的描述。
TDDB evaluation experiments are implemented on the thin gate oxides MOS capacitor, and a method of precise measurement and characterization the trap density and accumulative failure are presented.
采用恒定电流应力对薄栅氧化层MOS电容进行了TDDB评价实验，提出了精确测量和表征陷阱密度及累积失效率的方法。
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