RESULTS The measuring accuracy of low loss and high loss dielectric materials was high, and measuring errors were low.
结果对低损耗和高损耗介质的测量精度都较高，测量误差较小。
The newly developed low loss, low dielectric constant and low temperature co fired ceramics (LTCC) materials are the best substrate for microwave MCM technology.
新开发的低损耗、低介电常数的低温共烧陶瓷(L TCC)材料最适合做微波mcm的基板材料。
The measurement results of complex dielectric constants of low loss and thin flake materials, conductivity and nonequilibrium charge carrier lifetime of semiconductor are introduced.
介绍了测量片状小损耗介质介电常数、半导体电导率及非平衡载流子寿命等参数的结果。
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