The results can be used in modeling of conductivity modulation power devices under localized lifetime control.
着重分析了减损与延寿控制律的综合过程,提出其基于多目标优化方法的理论基础。
With this model, the forward characteristics of localized lifetime control NPT-IGBT influenced by the parameters of localized low-lifetime region are discussed in detail.
基于该模型,详细地分析了局域寿命区的参数对器件正向特性的影响。
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