analog linear circuits 模拟线性电路
For the linear analog circuits, a BIST method based on the system's state variables is presented.
本文针对线性模拟电路，提出了一种基于系统状态变量的BIST方法。
A novel approach for diagnosing signal parametric faults of linear analog circuits is presented in this paper.
提出一种检测线性模拟电路参数单故障的新方法。
In addition, this paper discusses the diagnosability and the selection of test frequencies in dynamic linear analog circuits.
本文还研究了电路的可诊断性以及测试频率的选择问题。
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