An algorithm using threshold selection and edge detection to extract target features from infrared image was proposed.
提出了一种阈值选取与边缘检测相结合提取红外图像特征的方法。
Image features extraction and selection are the premise of the defects classifier built-up.
缺陷图像的特征提取和选择是缺陷分类器设计的前提。
Through the fine circuit design and device selection, the experiment features in volume, power consumption, the quality of the image and the sensitivity are obtained.
通过合理的器件选择和电路设计，其在体积、功耗、图像质量、灵敏度等方面都有着较好的表现。
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