高解析 x 光绕射仪(High resolution X-ray diffractometer , HRXRD)及垂直面低掠角X 光绕射仪(In-plane GID XRD)是研究各式材料晶体 结构所不可或缺的利...
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The microstructure of carbon fibers has been studied using X-ray diffractometer (XRD), transmission electron microscope (TEM) and high-resolution transmission electron microscope (HRTEM).
利用X射线衍射(XRD)、透射电子显微镜(TEM)、高分辨电子显微镜(H RTEM)研究了碳纤维的微观结构。
The crystal structure and morphology of the as-synthesized product were characterized by X-ray diffractometer, scanning electron microscope and high-resolution transmission electron microscope.
利用X射线衍射仪、扫描电子显微镜和高分辨透射电子显微镜对所得产物的晶体结构和形貌进行了表征。
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