The method of a sort of uniform AMS IC DfT technique with low test cost and high fault coverage will meet the need of further development on IC design.
总之,低测试代价和高故障覆盖率的混合信号芯片的可测性设计方法将是系统级芯片进一步发展的要求和保障。
参考来源 - 系统级芯片的测试与可测性设计研究·2,447,543篇论文数据，部分数据来源于NoteExpress
The proposed method can generate simplified test patterns with high fault coverage, and can detect multiple faults as many as possible.
新方法可生成精简的、故障覆盖率高的测试图形，并尽可能多地检测多重故障。
Experimental results show that the proposed testing algorithms have merits such as high fault coverage, strong diagnostic ability and less testing time.
实验结果表明，此测试算法具有故障覆盖率高，诊断故障能力强，测试需要的时间少等优点。
This paper describes the fault models and test principles of the BS test access port (TAP) lines on PCBs. A test algorithm with high fault coverage and short time is then presented fort…
本文论述了板级边界扫描测试存取口的故障模型和测试原理，并针对全边界扫描印制板提出了一种故障覆盖率高、测试时间短的测试算法。
应用推荐