...GaN晶体辐射损伤的研究 道(Rutherford backscattering/channeling,RBS/C)和高分辨X射线衍射(high-resolution X-ray diffraction,HXRD)的实验测量,研究了不同剂量和不同角度Mg+注入GaN所造成的辐射损伤.
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high resolution x-ray diffraction 高分辨x射线衍射
high resolution x ray diffraction 高分辨x射线衍射的
high-resolution triple-axis x-ray diffraction 高分辨三轴晶x射线衍射
They were characterized by X-ray powder diffraction (XRD), transmission electron microscopy (TEM) and high-resolution transmission electron microscopy (HRTEM).
产物经x -射线粉末衍射(XRD)、透射电子显微镜(TEM)和高分辨电子显微镜(HRTEM)表征。
X ray diffraction (XRD), scanning electron microscopy (SEM), high resolution transmission electron microscopy (HRTEM), and photoluminescence (PL) are used to analyze the synthesized GaN nanorods.
用X射线衍射（XRD）、扫描电镜（SEM）、高分辨率透射电镜（HRTEM）和光致发光光谱（PL）对生成的产物进行了分析。
The effects of acid counteranions on the mesophases were investigated by X-ray diffraction and high-resolution transmission electron microscope.
采用小角X射线衍射和高分辨率透射电镜研究了不同酸根离子对产物介孔结构的影响。
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