基本参数法(fundamental parameter method，FP)是X射线荧光分析中一种方便有效的定量方法。它是在考虑各元素之间的吸收和增强效应的基础上，用标样或纯物...
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We have determined tin and lead contents in tin solder using the XRF fundamental parameter method without standard sample in this paper.
本文在无标样的情况下，用X射线荧光基本参数法测定了焊锡中的锡和铅的含量。
The Sulfur in catalyst have measured by X-Ray fluorescence spectrometry with Fundamental parameter method. The results agree with those obtained by chemical method.
采用X 射线荧光光谱中的基本参数法测定催化剂中硫元素含量， 测量结果与化学分析法一致。
The fundamental parameter method of X-ray fluorescence analysis has many advantages, such as no concentration range limitation of elements, dispensability of standard samples and so on.
本文叙述了利用基本参数法校正源激发合金元素荧光分析的基体效应的基本原理、基体效应的修正方法。
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