...全扫描设计, 有限回溯测试模式产生, n 对1紧耦合集成方式, 测试码并行, 单故障传播, 特大规模组合电路[gap=842]Key words: full scan-design, finite backtracing test pattern generation, n to 1 tight coupled integrating m..
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full scan design 全扫描设计
Thus, only a very small extra chip area is required even if full scan design is used.
这样，即使采用全扫描设计，也仅需较小的芯片面积。
The design of full-scan data includes test data and the corresponding test response in general, which are stored in the memory of Automatic Test Equipment (ATE).
全扫描设计中的数据包括测试激励数据以及测试响应所对应的期待响应值。
Full-scan design which upgrades the circuit in the controllability and observability greatly reduces the complexity of test generation, which is considered the most effective method of DFT.
全扫描设计通过提升电路的可控制性和可观察性，大大降低了测试生成的复杂度，被认为是最有效的可测性设计方法之一。
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