The thickness, XRD images, SEM pictures and electric hysteresis loops of these two thin films were analyzed and compared.
对两种铁电薄膜的厚度、XRD图谱、SEM图像和电滞回线进行了比较和分析。
The simultaneous measurements of the magnetic hysteresis loops and thickness-dependent electric conductance were performed in-situ during deposition process.
磁滞循环和依赖于厚度的电导率的同时测量沉积过程中被执行的现场。
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