In the present paper, threshold value method of diffracted intensity is put forward to process the test data, so the boundary of defect is legible.

采用衍射强度阈值法对测试数据进行处理，使得缺陷边界清晰可辨。

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The diffracted light intensity on axis of a Spatial light Modulator (SLM) with Multi-level Phase Fresnel Zone Plate (MPFZP) is studied by diffraction optical method.

用衍射光学方法研究了加有多级相位菲涅尔波带片(MPFZP)的空间光调制器(SLM)的轴上衍射光强。

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The use of photosensitive array makes it possible to obtain the distribution of diffracted light intensity with only one sampling.

由于本实验仪的光强采样部分使用了光敏阵列，从而一次采样即可得到衍射光强分布图形。

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