Reliability assessment based on circuit board accelerated degradation data are studied.
基于板级电路加速性能退化数据来研究电子产品可靠性评估问题。
参考来源 - 基于板级电路加速退化数据的可靠性分析·2,447,543篇论文数据,部分数据来源于NoteExpress
This paper narrates two storage life estimate methods about accelerated degradation data and compare the main process and appropriate scope of the two methods.
首先陈述了加速退化数据的两种评估方法,对比两种评估方法的主要过程和适用范围。
As a result, the performance and response time degradation experienced when the data center was initially lost will repeat every RetryInterval.
因而,最初丢失数据中心时经历的性能和响应时间降级将对每个RetryInterval重复一次。
Strictly speaking, these projects represent a cost of bad data in addition to degradation of business performance.
严格地说,这些项目反映了除业务性能降低之外还有劣质数据的损失。
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