...案图像压缩新方法 关键词 重复，缺陷模式，相似度，自然语言处理，信息检索 [gap=1139]Key words Duplicate, Defect Pattern, Similarity, Natural Language Processing, Information Retrieval ..
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Slip - A defect pattern of small ridges found on the surface of the wafer.
划伤- 晶圆片表面上的小皱造成的缺陷。
The flatness defect pattern recognition based on data mining technology was proposed.
介绍了建立带钢板形缺陷模式识别的数据挖掘过程。
Aim at the problem above, a method that USES extended defect pattern state machine to detect defects is given.
针对上述问题，本文提出了使用扩展的缺陷模式状态机进行缺陷检测的方法。
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