一般来说，晶 圆良率损失问题分析时，所考量之主要资料包含此 晶圆之制程参数、机台参数、晶圆缺陷资料(Defect data)、晶圆允收(Wafer Acceptance Test; WAT)资 料、晶圆测试(Circuit Probing; CP)资料、晶圆良率 资料等，而由于半导体厂工程师的分...
基于8个网页-相关网页
READ DEFECT DATA 读缺陷数据
Defect Data Analysis 缺陷数据分析
Analysis of software defect data 软件缺陷数据分析
data defect 数据误差
The main target here is to provide a set of reliable and accurate defect data records.
这里的主要目的是提供一套可靠而且准确的缺陷数据记录。
Based on this, the equipment defect data mining system based on J2EE is developed, which can make good use of the current and history defect data of the equipments.
设备及缺陷管理系统集成了大量的设备运行及缺陷管理信息，在此基础上开发的基于J2EE的设备缺陷数据挖掘系统，可以对设备当前及历史的缺陷数据进行很好的利用。
By analyzing the current and history defect data of electric equipments, we can predict the occurrence of future defect, so the service units can make preparation in advance.
电力系统设备缺陷预测是通过对设备当前和历史缺陷数据的分析，对未来可能发生的缺陷做出预测，帮助检修部门提前做好缺陷处理准备。
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