Presumably it is due to their different critical values of the ratio of slip plane hardening rate to current tensile stress for shear localization.
这可能是由于在不同状态时产生剪切形变局部化的滑移面硬化率对瞬时拉应力的临界比值不同之故。
Presumably, it is due to their different critical values of the ratio of slip plane hardening rate to current tensile stress for shear localization.
这可能是由于它们产生剪切形变局部化的滑移面硬化率对瞬时拉伸应力的临界比值不同之故。
The scan electric current decrease the tensile stress in the nano-beams, so the electric resistance increase with the scan electric current times.
在纳米梁电学测试中，反复扫描电流产生的热会减小梁上张应力，从而使电阻随扫描次数增大。
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