• 加速老化 - 引用次数：3

  While the reliability of GaN based LED Si substrate needs to be further studied. Current accelerated aging experiments under different stresses on LED chips have been carried out.

  本文用加速老化的方法研究了LED的可靠性。

  参考来源 - 硅衬底GaN基蓝光LED可靠性研究

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