The AES suggests that the interaction between gate metallization and GaAs active layer has taken place and the Schottky contact interface becomes ambiguous after stressing.
应力试验后的样品，肖特基势垒接触界面模糊，有明显的互扩散和反应发生．。
In the paper, the dam seepage analysis is conducted with no depth contact interface element to simulate layer surface.
本文采用无厚度的接触界面单元模拟层面，进行了坝体的渗流分析。
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