Atomic force microscopy generates very high-resolution images (about 5-nanometer resolution) by “feeling” the surface of a sample with a tiny probe tip.
原子力显微镜是运用一种微小的探针去“感受”样本表面，能得到高分辨率的影像（约5纳米的分辨率）。
Atomic force microscope (AFM) was invented as another nanoscale microscopy with high resolution based on scanning tunneling microscope (STM) and has extensive application in polymer field.
原子力显微镜(afm)是在扫描隧道显微镜(STM)基础上发明的又一种纳米级高分辨率显微技术，目前已在高分子领域获得了广泛的应用。
They were supplemented with surface topography and cross section images by atomic force microscopy and high-resolution transmission electron microscopy, respectively.
他们均附有表面的地形和截面图像原子力显微镜和高分辨率的透射电子显微镜，分别。
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