The paper introduces a new method of cross measuring by (el ec tric) theodolite, a new way of cross section area computation is also presented.

介绍利用（电子）经纬仪进行横断面测量的一种新方法，并提出横断面截面积计算的一种新思路。

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Before reliability calculation with the network flow method, the affective area of tie switch is knew through computation of the AC load flow.

在实现思路上，先通过交流潮流确定联络开关的切换范围，再用前述的网流法计算系统可靠性。

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The influence on over etching and under etching to IC layout is analyzed, the computation model and realization method of IC critical area are presented.

论文在分析过刻蚀和欠刻蚀对IC版图影响的基础上，提出了基于工艺偏差影响的IC关键面积计算新模型和实现方法。

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