Analysis of these correlations will give some semi-quantitative criteria for the observational tests of the correctness of synchrotron-self Compton effects.
分析这些相关性，可以提供一些半定量的理论判据，用以检验同步一自康普顿效应的正确性。
The initial experiments on and analysis of sheet resistance, contact, photomask alignment, line width, and correlations between device parameters and dopants have been made.
对薄层电阻、接触、光掩模对准、线条宽度、器件参数与掺杂的相关性等内容进行了初步试验和分析。
The total correlations between independent variable (X) and dependent variable (y) were divided into their component parts with the method of path analysis.
还利用了通径分析方法将自变量(X)与依变量(Y)问的总相关分剖为其组成部分。
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