An electron beam does not diffract at atomic scales, so it does not cause blurring of the edges of features.

由于电子束在原子尺度不会绕射，所以它不会使得图案细节的边缘模糊。

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The Young's modulus of silicon nano-beam on <100> direction was measured by bending test method using an atomic force microscope(AFM).

阐述了基于原子力显微镜（AFM）的弯曲测试测量纳米梁杨氏模量的理论和方法。

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Directed energy (DE) is an umbrella term covering technologies that produce a beam of concentrated electromagnetic energy or atomic or subatomic particles as a direct means to damage or destroy adversary equipment, facilities, and personnel.

FORBES: U.S. Navy Pioneers Next-Gen Electric Weaponry