A method is presented for measuring semiconductor resistor using ratio sampling techniques.
介绍一种采用比值采样测量半导体温度电阻的测量方法。
The semiconductor device includes a semiconductor substrate having an active region and a device isolation region defining the active region, and a resistor string formed over the active region.
该半导体器件包 括具有有源区和限定了有源区的器件隔离区的半导体衬底，以及形 成于有源区上方的电阻串。
According to photovoltaic principle of semiconductor, a required resistor layer is prepared on a semiconductor photovoltaic device.
本发明根据半导体光生伏打原理，并在半导体光伏器件上制备所需之电阻层。
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