高斯光束对标准硅球直径测量的影响分析。
Impact Analysis of Gaussian Beam on Measurement of Single Crystal Silicon Sphere Diameter.
根据高斯光束与理想平行光束的对比，给出了若干结论，从而保证了在利用光束衍射进行某些测量工作时的测量精度。
According to comparison between the Gaussian beam and ideal parallel beam, some conclusions are given which ensure the measuring fineness when we make some measurements with the beam diffraction.
进一步，通过对激光光束测量和高斯曲线拟合，验证了所提出方法的有效性。
Further, through the measurement of He-Ne laser beam and Gaussian fitting, the mentioned method is validated.
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