用X射线衍射（XRD）、扫描电镜（SEM）、高分辨率透射电镜（HRTEM）和光致发光光谱（PL）对生成的产物进行了分析。
X ray diffraction (XRD), scanning electron microscopy (SEM), high resolution transmission electron microscopy (HRTEM), and photoluminescence (PL) are used to analyze the synthesized GaN nanorods.
采用小角X射线衍射和高分辨率透射电镜研究了不同酸根离子对产物介孔结构的影响。
The effects of acid counteranions on the mesophases were investigated by X-ray diffraction and high-resolution transmission electron microscope.
射线衍射(XRD)、高分辨率透射电镜(HRTEM)和选区电子衍射(SAED)分析表明，该薄膜为非晶态。
The X-ray diffraction (XRD), high-resolution transmission electron microscopy (HRTEM) and selected area electron diffraction (SAED) results indicate that the sputtered film has an amorphous structure.
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