片状结构是一种典型的非高斯敝斑现象。
冷冻干燥前驱体呈非晶态，有残留的结晶水和氨，表面光滑，形貌主要为片状和条柱状，有少量六边形态。
The precursor of freeze - drying is amorphous with residual water and ammonia, having a smooth surface. The morphology is flaky, club - shaped and a little hexagonal.
介绍了测量片状小损耗介质介电常数、半导体电导率及非平衡载流子寿命等参数的结果。
The measurement results of complex dielectric constants of low loss and thin flake materials, conductivity and nonequilibrium charge carrier lifetime of semiconductor are introduced.
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