数字逻辑门电路作为集成电路被制造：所有组成的晶体管和电阻建立在一块半导体材料上。

Digital logic gate circuits are manufactured as integrated circuits: all the constituent transistors and resistors built on a single piece of semiconductor material.

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分析了CMOS逻辑门电路在运行时的电流特征，阐明了集成电路中数据与电磁辐射的相关性，建立了寄存器级电磁信息泄漏汉明距离模型。

The result shows that EM information leakage exists in CMOS integrated circuit during work, XOR operation in each round of DES is an attack point.

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介绍以中规模集成计数器为核心，结合中规模集成组合逻辑器件及少量门电路进行时序逻辑电路设计的方法。

This paper introduces one way to design scheduling logic circuit with medium-scale integrated counter at the core and based on MSI.

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