故障信息处理测试中的边界扫描技术探析 - 论文发表 - 论文秘籍网 关键词：边界扫描技术；JTAG；边界扫描设计 [gap=596]Key words: boundary scan technology; JTAG; boundary scan design
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边界扫描设计已逐渐成为芯片设计中不可或缺的部分，IEEE为其制定了相关标准，即ieee1149.1标准(也称为JTAG标准)。
So the design of boundary scan is essential in the design of chips. IEEE instituted a standard for it, and the standard is IEEE1149.1 (that can be called as JTAG standard also).
本文以usb逻辑分析仪作为一种典型的被测对象，进行了可测性设计的再开发工作，使其具有支持IEEE 1149.1边界扫描功能的设备结构。
This paper chooses USB logic analyzer as a typical tested object, and carries through a second develop to design it supporting IEEE 1149.1 boundary-scan function for testability.
本文概要论及与测试相关的设计特性，详细讨论了不同MCM的边界扫描测试策略。
This paper Outlines the design of features related to test and then details the Boundary Scan test strategies developed for different MCM.
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