XFS分析表明含铁量基本不变，证明上述变化仅发生在很薄的表面层。
XFS analysis demonstrated that the content of iron remained unchanged which proved that the above mentioned change occurred only on a very thin surface layer.
利用缺陷反应和扩散原理对表面层效应进行了初步分析，指出表面层效应的研究对改善和调节材料的电学性能具有重要的指导意义。
The analysis of surface effect is based on defect reaction and diffusion theory, the study for surface effect will have good guidance to the improvement of electrical properties.
本文讨论了样品表面层有微观应变梯度时X射线衍射线形分析的方法。
This paper deals with X-ray diffraction profile analysis for the sample with a micro-strain gradient in its surface layer.
应用推荐