针对手提式薄膜方块电阻测试仪在使用中容易出现的问题，进行分析研究，提出了解决方案，并在实验中得到实现。
Analyzing the problems which often happen in the portable square resistance meter for the thin films on ITO glass surface, some solutions were proposed and carried out by tests.
利用X射线衍射和能量散射X射线能谱表征方法，并结合薄膜方块电阻的测定，探讨了热处理方式和热处理温度对薄膜化学组成及薄膜电阻的影响。
Then, the effects of heat treatment and temperature on the chemical composition and sheet resistance of the prepared films were investigated by XRD, EDXS and sheet resistance measurements.
讨论了超薄金属膜结构中泡沫厚度对吸收峰位的影响，及金属薄膜的方块电阻对吸收峰值的影响。
It is concluded that the structure of ultra-thin metallic films can result in resonance absorbing, the absorbing performances were decided by both medium materials and metallic films.
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