最后介绍了边缘扫描测试技术，指出边缘扫描测试技术是功能自测试方法的有益补充，能够有效提高测试的故障隔离率。
In the end, the boundary scan test technology is introduced as the useful complement to functional self-test method, which can improve the fault isolation rate.
通过添加测试引脚、设计专用测试模式，内建自测试等方法有效的解决了该芯片电路的功能测试和电气性能测试。
The top metal test pad, special test mode and BIST are adopted in the IC circuits to solve the IC test problem about the chip function test and electric character test.
随机存储器在电子装备中广泛使用，对其进行有效测试是电子装备自测试与生产功能测试的主要内容。
RAM is used widely in electrical equipment, so RAM testing is a key part for built-in test and functional test.
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