本文研制了一种用于高精度膜厚监测的真空微量天平探头：半导体致冷器件恒温探头。
In this paper, a probe of vacuum microbalance to monitor and measure for high accuracy of film thickness is introduced, thermostatic probe of the semiconductor refrigeration device.
介绍了用电子分析天平测量平行板电容器两极板间的静电力和真空介电常量的原理和方法。
The theory and method in measuring accurately the electronic and vacuum dielectric constant of parallel plate capacitor are introduced.
应用推荐