... 闪点和自燃点的测试 Flash Point 4 电学性能的测试 Electrical Properties Testing 表面电阻、表面电阻率 Surface Resistivity ...
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本发明涉及低维纳米材料显微结构与电学性能的测试装置和方法。
The invention relates to a low-dimensional nano material microstructure and a device and a method for electrical performance testing.
本发明涉及一种纳米线的显微结构与电学性能测试装置。
The invention relates to a microstructure of a nano wire and an electrical performance testing device.
建立了高精度单电子器件测试系统。系统具有良好的温度控制、精确的电学特性测量和可加高强度磁场等性能。
The high precision single electron devices testing system with precision temperature controller, electronic characteristic testing and high magnetic field has been established.
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