本发明涉及一种纳米线的显微结构与电学性能测试装置。
The invention relates to a microstructure of a nano wire and an electrical performance testing device.
研制的天线罩较好地通过了力学、电学性能测试和无损检测。
The radome made of the selected material system successfully passed the mechanical and electrical test.
本发明涉及低维纳米材料显微结构与电学性能的测试装置和方法。
The invention relates to a low-dimensional nano material microstructure and a device and a method for electrical performance testing.
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