图11 、扫描式热梯度探针显微镜观察PP结晶热行为变化影像 3.6扫描式电场力显微镜(Electrical Force Microscope, EFM) 扫描式电场力显微镜利用Lift Mode operation (提升操作) 功能,首先将可导电之探...
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...网 anni ng Probe Microscope,SPM) 是用于测量材料表面不同性质的一类仪器, 其中电场力显微镜( Elect ric Force Microscope,EFM) 和磁力显微镜(Magnetic Force Micro2 scope,MFM) 主要用于测量材料表...
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DNA分子的拉直和导电性研究 - docin.com豆丁网 微镜的总称,包括扫描隧道显微镜(Scanning TunnelingMicroscope,STM)、电场力显微镜(ElectrostaticForce Microscope,EFM)、磁力显微镜(MagneticForceMicroscope,MFM)、 原子力显 微镜(Atomi
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扫描式电场力显微镜 Electrical Force Microscope ; EFM
文中对原子力显微镜(afm)电场诱导硅氧化结构的部分形状特征进行了分析和讨论。
This paper analyzes and discusses some structure's features on the surface of silicon by atomic force microscope (AFM) electrical field induced oxidation.
在现有的商用原子力显微镜上实现了用动态电场力显微术来研究单个纳米颗粒的极化特性。
Dynamic electric force microscopy was set up on a commercial atomic force microscope (AFM) to study the polarization of single nanocrystal.
用原子力显微镜(AFM)研究了电场诱导氧化理论以及偏置电压和脉冲时间对加工结构尺寸的影响。
The theory of field-induced oxidation and the impact of bias voltage and pulse time on the nanofabrication were studied by AFM.
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