生长条纹（growthstriation）又称聚形条纹（combination striation）、晶面条纹（stria,strintion）。是指单晶体中，出现于同一单形的各个晶面上的直线状条纹。它是在晶体成长过程中，由两个单形的细窄晶面成阶梯状生长反复交替出现而形成的。
此外还讨论了生长条纹、组分过冷、应力和位错等缺陷问题。
The defects such as growth striation constitutional supercooling, stress and dislocation are also dis-cussed in the paper.
在晶体中存在位错、包裹体、沉积物，沉积到和微包裹体缀饰的生长条纹；
There are dislocations, inclusions, precipitates, row of precipitates as well as growth horizons decorated by microinclusions in the crystals.
本文还对ACRT引起的强迫对流对固液界面形状、生长条纹和芯的影响进行了讨论。
The influences of ACRT on solid-liquid interface, growth striation and formation of core have been discussed.
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