温度扫描分析（Temperature Sweep）：采用温度扫描分析，可以同时观察到在不同温度条件下的电路特性，相当于该元件每次取不同的温度值进行多次仿真。
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温度扫描分析参数设置 Temperature Sweep
主要研究了环氧胶接接头在不同温度水中的老化行为，并用扫描电镜（SEM）和傅立叶红外光谱仪（ FTIR）分析了其失效的机理。
The effect of temperature on the aging performance of epoxy bonded joint in water was researched, and its failure mechanism was analyzed by SEM and FTIR.
本文通过有限元分析的方法讨论了不同电子束扫描轨迹对钎焊温度场的影响；
The influence of different EB scanning tracks on the brazing temperature field is discussed by the finite element analysis method.
采用透射电镜和扫描电镜对经不同卷曲温度卷曲的热轧内磁屏蔽钢中的第二相进行测试分析。
The effect of coiling temperature on second-phase of inter-magnetic shielded steel was observed and analyzed by transmission electron microscope (tem) and scanning electron microscope (SEM).
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