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在此基础上利用随机波动类模型对两种收益率的波动性特征进行拟合，并对拟合优度进行分析。
Based on this we simulate the volatility features of the two kinds of yield rate time series and analyze their fitting results using the stochastic volatility models.
随着集成电路特征尺寸的不断减小，互连线的串扰噪声对工艺波动的灵敏度也在相应增加。
As the IC feature size continues to decrease, interconnect cross-talk noise with the process fluctuation is also a corresponding increase in sensitivity.
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