与空气环境下得到的实验结果比较，在减压氩气环境下，谱线强度明显增强，自吸现象减小，谱线品质得到明显改善。

Comparing with the results obtained in air atmosphere, in the argon atmosphere at reduced pressure can obviously improve the quality of spectral line.

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与正折射率缺陷情形相比较，负折射率缺陷间的相互作用对缺陷模的影响更大，局域模谱线更宽。

Compared with the case of positive refractive index structural defects, the influence of the interaction between defects on defect modes is stronger, the spectrum-width of defect mode is broader.

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