... 晶体衍射 crystal diffraction 晶体衍射谱仪 crystal diffraction spectrometer 精细结构常数 fine structure constant ...
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衍射晶体光谱仪 diffracting crystal spectrometer
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X射线衍射仪、电子能谱仪、原子力显微镜和椭圆偏振仪等研究薄膜的击穿电压、介电常数、晶体结构、化学成分、表面形貌及薄膜的折射率。
The breakdown voltage, permittivity, crystal structure, composition, surface and refractive index of the thin films were studied by I-V, C-V, XRD, EDS, AFM and elliptical polarization instrument.
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