A constraint extraction method and a constraint path delay test generation algorithm are developed.
3.研究并实现了约束提取及约束下的非强健通路时延测试产生算法。
参考来源 - 基于指令的处理器时延测试产生方法·2,447,543篇论文数据，部分数据来源于NoteExpress
研究并实现了约束提取及约束下的非强健通路时延测试产生算法。
A constraint extraction method and a constraint path delay test generation algorithm are developed.
一个是可变双观测点的时延测试系统，它提供了从时延测试到故障诊断等一系列测试工具。
The other is a delay testing system based on variable double observations, including a TPG tool and a fault diagnosis tool.
通过如上性能的分析和测试，提出了降低啁啾光纤光栅器件时延波动、相位波动，优化其偏振模色散与偏振相关损耗的方法。
Through these measurement and analyse, bring forward the method to reduce the chirp FBG device's group delay ripple, phase ripple and optimize it's PMD and PDL.
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