... testing digital logic circuit 数字逻辑测试电路 tetrapolar 四端（网络）的 tetrode field-effect transistor 四极场效应晶体管 ...
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数字集成电路测试内容包括逻辑功能测试、直流参数测试和交流参数测试。
Digital IC test content includes logic functional test, test of DC parameters and test of AC parameters.
本文介绍了一种以MCS—51单片机为基础的TTL数字电路逻辑功能测试仪。
A new tester for the function of TTL digital circuit based on MCS-51 single chip computer is described.
为解决数字电路插板的测试问题，设计了80路逻辑信号发生器。
To settle the problem of testing logic card, we have designed an 80 channels logic generator.
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