文章分析了1149.4和1149.1标准的测试访问端口，以及测试逻辑结构和测试协议的异同，提出了模拟边界 扫描单元ABM和 数字边界 扫描单元DBM的行为模型；

The test access port and test logic architecture and protocol of 1149.4 and 1149.1 standards are analyzed, and behavior models for ABM and DBM are put forward.

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本文论述了板级边界扫描测试存取口的故障模型和测试原理，并针对全边界扫描印制板提出了一种故障覆盖率高、测试时间短的测试算法。

This paper describes the fault models and test principles of the BS test access port (TAP) lines on PCBs. A test algorithm with high fault coverage and short time is then presented fort…

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