Scanning ElectroChemical Microscopy 扫描电化学显微镜系统 VersaSCAN SECM 整合了定位系统、两台VersaSTAT恒电位仪和锥形抛光的超微电极探针为一体。
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选用典型的二氧化钛纳米超亲水薄膜，用扫描探针显微镜(SPM)和电化学测试系统进行一般性的表征。
A typical nanostructured titania super hydrophilic film was chosen for general characterization employing a Scanning Probe Microscope (SPM) and an electrochemical measurement system.
为提高扫描电化学显微镜（SECM）微定位系统的运动定位精度，对其压电工作台的数学模型和控制器设计进行了研究。
In order to improve the dynamic positioning precision of scanning electrochemistry microscope(SECM), the mathematic modeling and controller design of the piezo-stage are studied.
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