开关矩阵目的是控制电路的开启与闭合。自动测试设备中的信号开关系统通常由两个或多个矩阵开关组成，按照各种接口标准相互连接，形成从测试资源到UUT的灵活切换。
...术》—2009年第31期—龙源期刊网 关键词:继电器;开关矩阵;配线架;智能软件;配线检查 [gap=794]Key words: relay; switch matrix; distributing frame; intellectualized software; distributing check-up ...
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...维的网状网络(mesh)是理想选择：它可以处理大量并发消息，又有大量的路由可供选择。如果继续增加维度，在交叉开关矩阵(Crossbar)的控制下，任意核心都可以同其它任意核心建立通信，这样的高维网络显然拥有更好的性能，但设计难度也最大。
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总线开关矩阵 Crossbar Fabric
交点开关矩阵 crosspoint switching matrix
交叉开关矩阵 crosspoint switch matrix
受限开关矩阵 restricted switching matrix
速连开关矩阵 fast connect switch matrix
工件内存开关矩阵 job memory switch matrix JMSX
可编程开关矩阵 Programmable Switch Matrix
电子开关矩阵 electronic switch matrix ; electronic SPGA
矩阵开关 [电子] matrix switch
Hardware configurations of the automatic test system for T/R modules is achieved by reasonably selecting programmable measurement instruments according to the measurement requirements and then integrating them with the T/R module to be tested by a programmable switch matrix.
根据测量要求，合理选择可程控测量仪器，利用可程控开关矩阵将各测量仪器与被测件(T／R组件)有机地结合起来，完成了T／R组件自动测试系统的硬件配置。
参考来源 - 相控阵雷达T/R组件自动测试系统的研究与实现The switching matrix is to exchange messages between ATS and the circuit units for improving testing efficiency. A new type of switching matrix based on ARM microprocessor is introduced in this paper.
在自动测试系统中,开关矩阵主要功能是实现测试系统与被测电路单元之间的信息交换,提高测试效率。
参考来源 - 基于ARM微控制器的新型开关矩阵The switching matrix is to exchange messages between ATS and the circuit units for improving testing efficiency. A new type of switching matrix based on ARM microprocessor is introduced in this paper.
在自动测试系统中,开关矩阵主要功能是实现测试系统与被测电路单元之间的信息交换,提高测试效率。
参考来源 - 基于ARM微控制器的新型开关矩阵·2,447,543篇论文数据，部分数据来源于NoteExpress
本文给出了二种构造受限开关矩阵的方法。
In this paper, two methods for the construction of restricted switching matrixes are given.
视频开关矩阵完成对这些信号的统一切换，经放大驱动电路后输出到显示设备。
The video switching matrix completes the unified switching to these signals, which is output to display via amplifying-driving circuit.
介绍了一种基于I2C总线的大型开关矩阵结构及其功能，给出了其测试电路结构组成及控制电路组成。
The structure and function of a large-scale switch matrix which based on I2C bus are introduced, and its test circuit structure and control circuit structure are given.
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