在这两种应力条件下，应力导致的漏电流与时间的关系均服从幂函数关系，但是二者的幂指数不同。
Under both stress conditions stress induced leakage current follows a power law against stress time with different power factors.
其次，本文分别研究了FN隧穿应力和热空穴（HH）应力导致的超薄栅氧化层漏电流瞬态特性。
Secondly, the transient characteristics of FN tunneling and hot hole (HH) stress induced leakage current (SILC) in ultra-thin gate oxide are investigated respectively in this dissertation.
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