...框架_医网打尽文献搜索 关键词：并行测试生成；故障分解；与-并行功能分解；或-并行动能分解 [gap=704]Keywords：parallel ATPG;fault decomposition;AND-parallel functional decomposition;OR-parallel function ..
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然而，已有的电路并行测试生成算法并未取得理想的结果，尤其对时序电路。
However, the existing circuit parallel test generation algorithms fail get good results, especially for sequential circuit.
本文在总结已有并行技术的基础上，提出了并行测试生成系统的一种动态层次框架，并给出了一种实现方案。
Based on existing parallel techniques, this paper proposes a dynamic hierarchical framework for parallel ATPG and gives an implementation scheme.
提出了评价测试向量集及其生成算法的系统化方法，运用该方法对现有的并行测试生成算法进行了深入分析。
A new systematic method for evaluating interconnect testing algorithms is presented. Using this method, the parallel testing algorithms proposed in the literature are analyZed in detail.
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