利用模拟寿命试验的失效数据，统计推断产品的寿命分布函数是可靠性技术中的重要环节。
Making use of the failure datum of analog life test, it is an important link in reliability technique to reckon statistically the life distribution function.
指数分布是一种可以很好地描述某些电子元件的寿命的分布函数。
An index distribution is a distributing function which can describe the life-span of some electronic elements well.
本文讨论了ST函数在产品、系统寿命分布检验中的应用，并提供了一个实例。
This paper describes st function and its application in the test for products, system life distribution. Finally, a real example is given.
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