各种低阻测量的应用包括：接触电阻、超导体电阻和导体电阻率的测量等。

Low resistance measurement applications include contact resistance, superconductor resistance, and resistivity measurements of conductors.

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本文提出一种用直线四探针头测量金属-半导体欧姆接触接触电阻率的简捷方法。

In this paper, a simple method to measure the specific contact resistance of metal-semiconductor ohmic contact is developed, using the probe heads of the inline four probes.

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本文中提出了一种测量金属-半导体欧姆接触比接触电阻的新方法-圆环结构测试法。

In this paper, a method to determine the specific contact resistance of metal-semiconductor contact — circular ring structure method is presented.

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