进行类内方法测试时，将测试点分为四种，并分别论述适用于每种测试点位置的探针函数的设置。

During the method testing inside the class, the testing points are divided into four kinds and the installation of each probe function which matches the location is discussed.

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并提供了自制四探针测量仪的方法。

The method to make four point probe instrument is provided.

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本文提出一种用直线四探针头测量金属-半导体欧姆接触接触电阻率的简捷方法。

In this paper, a simple method to measure the specific contact resistance of metal-semiconductor ohmic contact is developed, using the probe heads of the inline four probes.

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